Publication detail

Noise Measurement of High-Ohm Metal-Oxide Resistors

ZDRAŽIL, L. ROUBAL, Z.

Original Title

Noise Measurement of High-Ohm Metal-Oxide Resistors

Type

conference paper

Language

English

Original Abstract

This paper deals with the comparison of low-frequency noise of high-ohm metal-oxide resistors and resistors made by thick-layer technology. For measuring very small currents in the order of hundreds of pA to units of fA, a feedback ammeter is very often used, where high-ohm resistors must be connected to the feedback of a precision operational amplifier. Feedback resistors can reach resistance of several hundred GΩ. As the resistance increases, the level of Johnson´s thermal noise also increases. Most high-ohm resistors are manufactured by thick-layer technology that generates also low-frequency flicker noise with a frequency dependence of 1/f. Resistors based on metal-oxide technology should not generate low-frequency flicker noise, but their price is several times higher than the price of resistors made using thick-layer technology.

Keywords

Metal-Oxide Resistors, High-Ohm Resistors, Flicker Noise, Thermal Noise

Authors

ZDRAŽIL, L.; ROUBAL, Z.

Released

4. 6. 2025

Publisher

Institute of Measurement Science, Slovak Academy of Sciences

Location

Smolenice Castle, Slovakia

ISBN

978-80-69159-00-6

Book

MEASUREMENT 2025: Proceedings of the 15th International Conference on Measurement

Pages from

40

Pages to

43

Pages count

4

URL

BibTex

@inproceedings{BUT198073,
  author="Lukáš {Zdražil} and Zdeněk {Roubal}",
  title="Noise Measurement of High-Ohm Metal-Oxide Resistors",
  booktitle="MEASUREMENT 2025: Proceedings of the 15th International Conference on Measurement",
  year="2025",
  pages="40--43",
  publisher="Institute of Measurement Science, Slovak Academy of Sciences",
  address="Smolenice Castle, Slovakia",
  isbn="978-80-69159-00-6",
  url="https://measurement.sk/M2025/doc/Proceedings-2025.pdf"
}