Publication detail
Noise Measurement of High-Ohm Metal-Oxide Resistors
ZDRAŽIL, L. ROUBAL, Z.
Original Title
Noise Measurement of High-Ohm Metal-Oxide Resistors
Type
conference paper
Language
English
Original Abstract
This paper deals with the comparison of low-frequency noise of high-ohm metal-oxide resistors and resistors made by thick-layer technology. For measuring very small currents in the order of hundreds of pA to units of fA, a feedback ammeter is very often used, where high-ohm resistors must be connected to the feedback of a precision operational amplifier. Feedback resistors can reach resistance of several hundred GΩ. As the resistance increases, the level of Johnson´s thermal noise also increases. Most high-ohm resistors are manufactured by thick-layer technology that generates also low-frequency flicker noise with a frequency dependence of 1/f. Resistors based on metal-oxide technology should not generate low-frequency flicker noise, but their price is several times higher than the price of resistors made using thick-layer technology.
Keywords
Metal-Oxide Resistors, High-Ohm Resistors, Flicker Noise, Thermal Noise
Authors
ZDRAŽIL, L.; ROUBAL, Z.
Released
4. 6. 2025
Publisher
Institute of Measurement Science, Slovak Academy of Sciences
Location
Smolenice Castle, Slovakia
ISBN
978-80-69159-00-6
Book
MEASUREMENT 2025: Proceedings of the 15th International Conference on Measurement
Pages from
40
Pages to
43
Pages count
4
URL
BibTex
@inproceedings{BUT198073,
author="Lukáš {Zdražil} and Zdeněk {Roubal}",
title="Noise Measurement of High-Ohm Metal-Oxide Resistors",
booktitle="MEASUREMENT 2025: Proceedings of the 15th International Conference on Measurement",
year="2025",
pages="40--43",
publisher="Institute of Measurement Science, Slovak Academy of Sciences",
address="Smolenice Castle, Slovakia",
isbn="978-80-69159-00-6",
url="https://measurement.sk/M2025/doc/Proceedings-2025.pdf"
}