Detail publikačního výsledku
Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
SCHMIEDOVÁ, V.; HEINRICHOVÁ, P.; ZMEŠKAL, O.; WEITER, M.
Original Title
Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
English Title
Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
Type
WoS Article
Original Abstract
This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.
English abstract
This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.
Keywords
Organic materials; spectroscopic ellipsometry; solar cells; UV-VIS absorption; profilometry
Key words in English
Organic materials; spectroscopic ellipsometry; solar cells; UV-VIS absorption; profilometry
Authors
SCHMIEDOVÁ, V.; HEINRICHOVÁ, P.; ZMEŠKAL, O.; WEITER, M.
RIV year
2016
Released
15.09.2015
Publisher
Applied surface science
Location
North-Holland
ISBN
0169-4332
Periodical
APPLIED SURFACE SCIENCE
Volume
349
Number
10
State
Kingdom of the Netherlands
Pages from
582
Pages to
588
Pages count
7
URL
Full text in the Digital Library
BibTex
@article{BUT114511,
author="Veronika {Schmiedová} and Patricie {Heinrichová} and Oldřich {Zmeškal} and Martin {Weiter}",
title="Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry",
journal="APPLIED SURFACE SCIENCE",
year="2015",
volume="349",
number="10",
pages="582--588",
doi="10.1016/j.apsusc.2015.05.027",
issn="0169-4332",
url="http://www.sciencedirect.com/science/article/pii/S0169433215011253"
}