Detail publikačního výsledku
High resolution measuring with X-ray computed tomography
BŘÍNEK, A.; TESAŘOVÁ, M.; ZIKMUND, T.; KAISER, J.
Original Title
High resolution measuring with X-ray computed tomography
English Title
High resolution measuring with X-ray computed tomography
Type
Paper in proceedings (conference paper)
Original Abstract
The ability to inspect the interior of an object in a nondestructive was is of fundamental importance in a wide range of academic and industrial applications, raging from life science research, to medical diagnosis. X-ray tomography provides a tool to obtain 3D image of the object computed by the reconstruction algorithm. In recent years, significant progress has been made in the field of advanced X-ray computed tomography (CT) imaging, pushing the limit of voxel resolution far beyond 1 micrometer. On the four samples are shown the possibilities of achieved resolutions.
English abstract
The ability to inspect the interior of an object in a nondestructive was is of fundamental importance in a wide range of academic and industrial applications, raging from life science research, to medical diagnosis. X-ray tomography provides a tool to obtain 3D image of the object computed by the reconstruction algorithm. In recent years, significant progress has been made in the field of advanced X-ray computed tomography (CT) imaging, pushing the limit of voxel resolution far beyond 1 micrometer. On the four samples are shown the possibilities of achieved resolutions.
Keywords
X-ray computed tomography, high resolution measuring,
Key words in English
X-ray computed tomography, high resolution measuring,
Authors
BŘÍNEK, A.; TESAŘOVÁ, M.; ZIKMUND, T.; KAISER, J.
RIV year
2018
Released
20.04.2017
Location
Telč
ISBN
9788021085503
Book
Book of Abstracts CEITEC PhD Retreat II
Pages from
69
Pages to
69
Pages count
138
Full text in the Digital Library
BibTex
@inproceedings{BUT137872,
author="Adam {Břínek} and Markéta {Kaiser} and Tomáš {Zikmund} and Jozef {Kaiser}",
title="High resolution measuring with X-ray computed tomography",
booktitle="Book of Abstracts CEITEC PhD Retreat II",
year="2017",
pages="69--69",
address="Telč",
isbn="9788021085503"
}