Publication result detail
Detection of the Yogurt Incubation Kinetics by Portable Impedance Converter
ZHIVKOV, I.; VAŠÍČEK, Z.; SLAVÍKOVÁ, Z.; YORDANOV, R; EHLICH, J.
Original Title
Detection of the Yogurt Incubation Kinetics by Portable Impedance Converter
English Title
Detection of the Yogurt Incubation Kinetics by Portable Impedance Converter
Type
Paper in proceedings (conference paper)
Original Abstract
Impedance microbiology based on AD5940 single-chip convertor measurement by gold interdigital electrodes could be a valuable method for tracking and control the yogurt fermentation process with portable sensor device. The results obtained are with a good agreement with pH kinetics measurement, which is a typical method for yogurt fermentation detection in the food industry.
English abstract
Impedance microbiology based on AD5940 single-chip convertor measurement by gold interdigital electrodes could be a valuable method for tracking and control the yogurt fermentation process with portable sensor device. The results obtained are with a good agreement with pH kinetics measurement, which is a typical method for yogurt fermentation detection in the food industry.
Keywords
AD5940 2-wire impedance measurement, Lactobacillus delbrueckii subsp. bulgaricus, probiotic, yogurt fermentation monitoring.
Key words in English
AD5940 2-wire impedance measurement, Lactobacillus delbrueckii subsp. bulgaricus, probiotic, yogurt fermentation monitoring.
Authors
ZHIVKOV, I.; VAŠÍČEK, Z.; SLAVÍKOVÁ, Z.; YORDANOV, R; EHLICH, J.
RIV year
2021
Released
16.09.2020
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISBN
978-1-7281-7426-6
Book
29th International Scientific Conference Electronics, ET 2020 – Proceedings
Pages from
1
Pages to
4
Pages count
1
URL
BibTex
@inproceedings{BUT169572,
author="ZHIVKOV, I. and VAŠÍČEK, Z. and SLAVÍKOVÁ, Z. and YORDANOV, R and EHLICH, J.",
title="Detection of the Yogurt Incubation Kinetics by Portable Impedance Converter",
booktitle="29th International Scientific Conference Electronics, ET 2020 – Proceedings",
year="2020",
pages="1--4",
publisher="Institute of Electrical and Electronics Engineers Inc.",
doi="10.1109/ET50336.2020.9238319",
isbn="978-1-7281-7426-6",
url="https://www.scopus.com/record/display.uri?eid=2-s2.0-85097061085&origin=resultslist"
}