Publication detail
28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
BOSIO, A. BERNARDI, P. TRAIOLA, M. MRÁZEK, V.
Original Title
28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Type
conference proceedings
Language
English
Original Abstract
This proceedings contains reviewed papers accepted for publication and presentation at the 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2025). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.
Keywords
electronic circuit, design, test, design method, digital circuit, analog circuit
Authors
BOSIO, A.; BERNARDI, P.; TRAIOLA, M.; MRÁZEK, V.
Released
1. 5. 2025
Publisher
Institute of Electrical and Electronics Engineers
Location
Lyon
ISBN
979-8-3315-2801-0
Pages count
168
BibTex
@proceedings{BUT197714,
editor="BOSIO, A. and BERNARDI, P. and TRAIOLA, M. and MRÁZEK, V.",
title="28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
year="2025",
pages="168",
publisher="Institute of Electrical and Electronics Engineers",
address="Lyon",
doi="10.1109/DDECS63720.2025",
isbn="979-8-3315-2801-0"
}