Detail publikace

28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

BOSIO, A. BERNARDI, P. TRAIOLA, M. MRÁZEK, V.

Originální název

Typ

konferenční sborník (ne článek)

Jazyk

angličtina

Originální abstrakt

This proceedings contains reviewed papers accepted for publication and presentation at the 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2025). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Klíčová slova

electronic circuit, design, test, design method, digital circuit, analog circuit

Autoři

BOSIO, A.; BERNARDI, P.; TRAIOLA, M.; MRÁZEK, V.

Vydáno

1. 5. 2025

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Lyon

ISBN

979-8-3315-2801-0

Strany počet

168

BibTex

@proceedings{BUT197714,
  editor="BOSIO, A. and BERNARDI, P. and TRAIOLA, M. and MRÁZEK, V.",
  title="28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2025",
  pages="168",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Lyon",
  doi="10.1109/DDECS63720.2025",
  isbn="979-8-3315-2801-0"
}