Publication detail

Structural analysis of imperfections in contacts of graphene chemiresistors

KASPAR, P. ŠIŠKA VIRÁGOVÁ, E. DALLAEV, R. PAPEŽ, N. MACKŮ, R. GRMELA, L. ŠIK, O. SEDLÁK, P. SOBOLA, D.

Original Title

Type

journal article in Web of Science

Language

English

Original Abstract

The aim of the presented paper is to take a commercially available prefabricated field effect graphene transistor sensor and to expose it to conditions of normal operation, which are different from clean and standardized laboratory conditions The effect of commonly present gases, humidity, light, possible contaminations like carbon and other phenomena have been allowed to interact with the sensor, which was then analyzed by a series of tests. The structure has been observed by Scanning Transmission Electron Microscopy (STEM), which included both High-Angle Annular Dark Field (HAADF) imaging and energy-dispersive X-ray spectroscopy (EDX). This method, together with Raman spectroscopy and secondary Ion Mass Spectroscopy (SIMS), was used to obtain information about chemical composition. Lastly, the electric properties were observed by taking the current–voltage (IV) characteristics as well as spectral density of current noise to observe changes to the sensor operation ability. The obtained data provide insight into the changes in structure, composition and behavior of the carbon sensor under non-laboratory conditions in order to establish the viability of the sensors in question in practical, less than ideal circumstances in contrast to commonly presented information from pristine, uncontaminated device in ideal laboratory conditions.

Keywords

Graphene; Sensor; SEM; EDX; SIMS

Authors

KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D.

Released

11. 5. 2025

Publisher

Elsevier

ISBN

1873-5584

Periodical

APPLIED SURFACE SCIENCE

Year of study

704

Number

163501

State

Kingdom of the Netherlands

Pages count

URL

https://www.sciencedirect.com/science/article/pii/S0169433225012164

BibTex

@article{BUT197877,
  author="Pavel {Kaspar} and Eliška {Šiška Virágová} and Rashid {Dallaev} and Nikola {Papež} and Robert {Macků} and Lubomír {Grmela} and Ondřej {Šik} and Petr {Sedlák} and Dinara {Sobola}",
  title="Structural analysis of imperfections in contacts of graphene chemiresistors",
  journal="APPLIED SURFACE SCIENCE",
  year="2025",
  volume="704",
  number="163501",
  pages="6",
  doi="10.1016/j.apsusc.2025.163501",
  issn="1873-5584",
  url="https://www.sciencedirect.com/science/article/pii/S0169433225012164"
}