Detail publikace

Structural analysis of imperfections in contacts of graphene chemiresistors

KASPAR, P. ŠIŠKA VIRÁGOVÁ, E. DALLAEV, R. PAPEŽ, N. MACKŮ, R. GRMELA, L. ŠIK, O. SEDLÁK, P. SOBOLA, D.

Originální název

Structural analysis of imperfections in contacts of graphene chemiresistors

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The aim of the presented paper is to take a commercially available prefabricated field effect graphene transistor sensor and to expose it to conditions of normal operation, which are different from clean and standardized laboratory conditions The effect of commonly present gases, humidity, light, possible contaminations like carbon and other phenomena have been allowed to interact with the sensor, which was then analyzed by a series of tests. The structure has been observed by Scanning Transmission Electron Microscopy (STEM), which included both High-Angle Annular Dark Field (HAADF) imaging and energy-dispersive X-ray spectroscopy (EDX). This method, together with Raman spectroscopy and secondary Ion Mass Spectroscopy (SIMS), was used to obtain information about chemical composition. Lastly, the electric properties were observed by taking the current–voltage (IV) characteristics as well as spectral density of current noise to observe changes to the sensor operation ability. The obtained data provide insight into the changes in structure, composition and behavior of the carbon sensor under non-laboratory conditions in order to establish the viability of the sensors in question in practical, less than ideal circumstances in contrast to commonly presented information from pristine, uncontaminated device in ideal laboratory conditions.

Klíčová slova

Graphene; Sensor; SEM; EDX; SIMS

Autoři

KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D.

Vydáno

11. 5. 2025

Nakladatel

Elsevier

ISSN

1873-5584

Periodikum

APPLIED SURFACE SCIENCE

Ročník

704

Číslo

163501

Stát

Nizozemsko

Strany počet

6

URL

https://www.sciencedirect.com/science/article/pii/S0169433225012164

BibTex

@article{BUT197877,
  author="Pavel {Kaspar} and Eliška {Šiška Virágová} and Rashid {Dallaev} and Nikola {Papež} and Robert {Macků} and Lubomír {Grmela} and Ondřej {Šik} and Petr {Sedlák} and Dinara {Sobola}",
  title="Structural analysis of imperfections in contacts of graphene chemiresistors",
  journal="APPLIED SURFACE SCIENCE",
  year="2025",
  volume="704",
  number="163501",
  pages="6",
  doi="10.1016/j.apsusc.2025.163501",
  issn="1873-5584",
  url="https://www.sciencedirect.com/science/article/pii/S0169433225012164"
}