Detail publikace
Structural analysis of imperfections in contacts of graphene chemiresistors
KASPAR, P. ŠIŠKA VIRÁGOVÁ, E. DALLAEV, R. PAPEŽ, N. MACKŮ, R. GRMELA, L. ŠIK, O. SEDLÁK, P. SOBOLA, D.
Originální název
Structural analysis of imperfections in contacts of graphene chemiresistors
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
The aim of the presented paper is to take a commercially available prefabricated field effect graphene transistor sensor and to expose it to conditions of normal operation, which are different from clean and standardized laboratory conditions The effect of commonly present gases, humidity, light, possible contaminations like carbon and other phenomena have been allowed to interact with the sensor, which was then analyzed by a series of tests. The structure has been observed by Scanning Transmission Electron Microscopy (STEM), which included both High-Angle Annular Dark Field (HAADF) imaging and energy-dispersive X-ray spectroscopy (EDX). This method, together with Raman spectroscopy and secondary Ion Mass Spectroscopy (SIMS), was used to obtain information about chemical composition. Lastly, the electric properties were observed by taking the current–voltage (IV) characteristics as well as spectral density of current noise to observe changes to the sensor operation ability. The obtained data provide insight into the changes in structure, composition and behavior of the carbon sensor under non-laboratory conditions in order to establish the viability of the sensors in question in practical, less than ideal circumstances in contrast to commonly presented information from pristine, uncontaminated device in ideal laboratory conditions.
Klíčová slova
Graphene; Sensor; SEM; EDX; SIMS
Autoři
KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D.
Vydáno
11. 5. 2025
Nakladatel
Elsevier
ISSN
1873-5584
Periodikum
APPLIED SURFACE SCIENCE
Ročník
704
Číslo
163501
Stát
Nizozemsko
Strany počet
6
URL
BibTex
@article{BUT197877,
author="Pavel {Kaspar} and Eliška {Šiška Virágová} and Rashid {Dallaev} and Nikola {Papež} and Robert {Macků} and Lubomír {Grmela} and Ondřej {Šik} and Petr {Sedlák} and Dinara {Sobola}",
title="Structural analysis of imperfections in contacts of graphene chemiresistors",
journal="APPLIED SURFACE SCIENCE",
year="2025",
volume="704",
number="163501",
pages="6",
doi="10.1016/j.apsusc.2025.163501",
issn="1873-5584",
url="https://www.sciencedirect.com/science/article/pii/S0169433225012164"
}