Analysis of surface morphology of plasma polymer films using atomic force microscopy

Analysis of surface morphology of plasma polymer films using atomic force microscopy

Paper in proceedings (conference paper)

For thin polymer films, the surface roughness is one of the very important properties, which affects many other properties such as wettability, adhesion, friction etc. The present work describes the analysis of surface roughness of plasma polymer films of vinyltriethoxysilane and tetravinylsilane by atomic force microscopy. The films of different thickness were prepared at constant deposition conditions and the surface roughness was greatly influenced by the film thickness variation in case of vinyltriethoxysilane. An influence of RF power, used for film deposition of tetravinylsilane, on the surface roughness was observed for films of the same thickness.

For thin polymer films, the surface roughness is one of the very important properties, which affects many other properties such as wettability, adhesion, friction etc. The present work describes the analysis of surface roughness of plasma polymer films of vinyltriethoxysilane and tetravinylsilane by atomic force microscopy. The films of different thickness were prepared at constant deposition conditions and the surface roughness was greatly influenced by the film thickness variation in case of vinyltriethoxysilane. An influence of RF power, used for film deposition of tetravinylsilane, on the surface roughness was observed for films of the same thickness.

Plasma polymerization, surface morphology, atomic force microscopy

Plasma polymerization, surface morphology, atomic force microscopy

TRIVEDI, R.; ČECH, V.

13.12.2007

Juniormat 07

121

124

4

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