Publication result detail
A study on the thickness homogeneity and refractive index of thin organic layers
ZMEŠKAL, O.; SALYK, O.; VESELÝ, M.; DZIK, P.
Original Title
A study on the thickness homogeneity and refractive index of thin organic layers
English Title
A study on the thickness homogeneity and refractive index of thin organic layers
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
This paper deals with the utilization of optical and interference microscopy for the study of thin film layers.
English abstract
This paper deals with the utilization of optical and interference microscopy for the study of thin film layers.
Keywords
refractive index, thickness of layers, interefernce microscopy, optical microscopy
Key words in English
refractive index, thickness of layers, interefernce microscopy, optical microscopy
Authors
ZMEŠKAL, O.; SALYK, O.; VESELÝ, M.; DZIK, P.
RIV year
2010
Released
09.09.2008
Publisher
Asociace českých chemických společností
Location
Brno
ISBN
1213-7103
Periodical
CHEMICKE LISTY
Volume
102
Number
S
State
Czech Republic
Pages from
s1033
Pages to
s1036
Pages count
4