Spectroscopic ellipsometry study of plasma-polymerised vinyltriethoxysilane films

Spectroscopic ellipsometry study of plasma-polymerised vinyltriethoxysilane films

Peer-reviewed article not indexed in WoS or Scopus

Plasma-polymerised vinyltriethoxysilane (pp-VTES) films with thicknesses ranging from 20 nm to about 5 micron were studied by combined method of spectroscopic ellipsometry and optical reflectivity in VIS and UV spectral zone. For these photon energies Tauc-Lorentz dielectric function (with a band gap of about 2.5 eV) was found to be an appropriate parameterisation of pp-VTES optical constants. Various sample models, accounting for the presence of film interfaces, film refractive index gradient profile and film thickness non uniformity were considered. Pp-VTES films (t < 1 m) can be considered as homogeneous films, whereas thick films show imperfections, which dominant character was assigned to film thickness non uniformity.

Plasma-polymerised vinyltriethoxysilane (pp-VTES) films with thicknesses ranging from 20 nm to about 5 micron were studied by combined method of spectroscopic ellipsometry and optical reflectivity in VIS and UV spectral zone. For these photon energies Tauc-Lorentz dielectric function (with a band gap of about 2.5 eV) was found to be an appropriate parameterisation of pp-VTES optical constants. Various sample models, accounting for the presence of film interfaces, film refractive index gradient profile and film thickness non uniformity were considered. Pp-VTES films (t < 1 m) can be considered as homogeneous films, whereas thick films show imperfections, which dominant character was assigned to film thickness non uniformity.

thin film; plasma polymerization; ellipsometry

thin film; plasma polymerization; ellipsometry

MISTRÍK, J.; ČECHALOVÁ, B.; STUDÝNKA, J.; ČECH, V.

2010

22.12.2009

0957-4522

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

20

1

Kingdom of the Netherlands

S451

S455

5

http://hdl.handle.net/