Detail publikačního výsledku

Optimized Impedance Measurement with AD5933

EHLICH, J.; ZHIVKOV, I.; YORDANOV, R.; SALYK, O.; WEITER, M.

Originální název

Optimized Impedance Measurement with AD5933

Anglický název

Optimized Impedance Measurement with AD5933

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The publication describes a new method of better impedance measuremnt with AD5933 chip with custom analog frontend.

Anglický abstrakt

The publication describes a new method of better impedance measuremnt with AD5933 chip with custom analog frontend.

Klíčová slova

Impedance, AD5933, analog frontend

Klíčová slova v angličtině

Impedance, AD5933, analog frontend

Autoři

EHLICH, J.; ZHIVKOV, I.; YORDANOV, R.; SALYK, O.; WEITER, M.

Vydáno

14.05.2020

Nakladatel

International Spring Seminar on Electronics Technology

Místo

Slovakia

ISBN

9781728167732

Kniha

Proceedings of the International Spring Seminar on Electronics Technology

Edice

May 2020

Strany od

1

Strany do

6

Strany počet

6

URL

https://ieeexplore.ieee.org/document/9121159

BibTex

@inproceedings{BUT164754,
  author="EHLICH, J. and ZHIVKOV, I. and YORDANOV, R. and SALYK, O. and WEITER, M.",
  title="Optimized Impedance Measurement with AD5933",
  booktitle="Proceedings of the International Spring Seminar on Electronics Technology",
  year="2020",
  series="May 2020",
  pages="1--6",
  publisher="International Spring Seminar on Electronics Technology",
  address="Slovakia",
  doi="10.1109/ISSE49702.2020.9121159",
  isbn="9781728167732",
  url="https://ieeexplore.ieee.org/document/9121159"
}