Detail výsledku s přesahem do praxe
Characterization of pp-TVS films by spectroscopic ellipsometry
ČECHALOVÁ, B.; STUDÝNKA, J.; ČECH, V.
Originální název
Characterization of pp-TVS films by spectroscopic ellipsometry
Anglický název
Characterization of pp-TVS films by spectroscopic ellipsometry
Druh
Audiovizuální tvorba
Originální abstrakt
We have focused on characterization of plasma polymer films using spectroscopic ellipsometry in this work. The determination of dispersion curves of the refractive index and extinction coefficient for films deposited at different process parameters has been the primary aim of our study.
Anglický abstrakt
We have focused on characterization of plasma polymer films using spectroscopic ellipsometry in this work. The determination of dispersion curves of the refractive index and extinction coefficient for films deposited at different process parameters has been the primary aim of our study.
Klíčová slova
ellipsometry thin film plasma polymerization
Klíčová slova v angličtině
ellipsometry thin film plasma polymerization
Autoři
ČECHALOVÁ, B.; STUDÝNKA, J.; ČECH, V.
Vydáno
28.11.2006
Místo
Berlin
ISBN
3000187510
Edice
BAM
URL
Plný text v Digitální knihovně
BibTex
@misc{BUT63475,
author="Božena {Čechalová} and Jan {Studýnka} and Vladimír {Čech}",
title="Characterization of pp-TVS films by spectroscopic ellipsometry",
year="2006",
series="BAM",
edition="2006",
address="Berlin",
isbn="3000187510",
url="http://www.ake.bam.de/workshop-ellipsometry-2006/index.html",
note="Audiovisual work"
}