Detail publikačního výsledku

Physical Propertie of Plasmatic and Evaporated Polysilylenes

SALYK, O., HORVÁTH, P., WEITER, M., SCHAUER, F.

Originální název

Physical Propertie of Plasmatic and Evaporated Polysilylenes

Anglický název

Physical Propertie of Plasmatic and Evaporated Polysilylenes

Druh

Konferenční sborník (ne stať)

Originální abstrakt

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

Anglický abstrakt

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

Klíčová slova

polysilane, electroluminescence

Klíčová slova v angličtině

polysilane, electroluminescence

Autoři

SALYK, O., HORVÁTH, P., WEITER, M., SCHAUER, F.

Vydáno

01.01.1998

Nakladatel

Ústav fyziky SAV

Místo

Bratislava

Kniha

Interantional Workshop on Diagnostic of Solid State Surfaces

Edice

1998

Strany od

24

Strany počet

1

BibTex

@proceedings{BUT64261,
  editor="Ota {Salyk} and Pavel {Horváth} and Martin {Weiter} and František {Schauer}",
  title="Physical Propertie of Plasmatic and Evaporated Polysilylenes",
  year="1998",
  series="1998",
  pages="1",
  publisher="Ústav fyziky SAV",
  address="Bratislava"
}